Probe Tester - List of Manufacturers, Suppliers, Companies and Products

Probe Tester Product List

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Dual Side Flying Probe Tester: APT-1600FD

Dual Side Flying Probe Tester: APT-1600FD

This is a flagship model that arranges probe heads above and below, enabling simultaneous in-circuit testing of both sides of the substrate.

Four probes are arranged on the top side of the substrate and two on the bottom side. Each probe can move freely and at high speed, achieving an astonishing inspection speed that is world-class in standard. By using the upper and lower flying probes simultaneously, a combination inspection of up to six probes allows for simultaneous contact inspection at both points on the top and bottom sides of the substrate. This significantly expands the inspection range and further accelerates inspection time. It is equipped with a wealth of features and boasts world-class standards in speed and positioning accuracy. ★You can bring your substrate to our demo room at our Okayama headquarters for evaluation testing★ We can conduct a series of tests including the creation of inspection programs, inspections using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

  • Measurement and Inspection

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Dual Side Flying Probe Tester APT-1600FD-SL

Dual Side Flying Probe Tester APT-1600FD-SL

The probe heads are arranged above and below, allowing for simultaneous in-circuit testing of both sides of the substrate. (Supported substrate size for inspection: up to 985×610)

The simultaneous use of upper and lower flying probes allows for a combination inspection of up to 6 probes, enabling the inspection of components that can make contact at both points on the top and bottom of the substrate. This model boasts world-class standards in speed and positioning accuracy while expanding the compatible substrate size to W635×D610mm. Additionally, by adding an optional split inspection function, it can also inspect long substrates up to W985×D610mm. It can accommodate component heights of up to 60mm and substrate weights of up to 10kg, making it suitable for inspecting substrates used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★Evaluation tests can be conducted by bringing in substrates to the demo room at our Okayama headquarters★ A complete testing process is possible, including the creation of inspection programs, testing using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

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The fastest in-circuit test! What are the features of a flying probe tester?

The fastest in-circuit test! What are the features of a flying probe tester?

The Takaya APT series is a board inspection device capable of ultra-fast in-circuit testing at an industry-leading level.

The Takaya APT series is a flying probe in-circuit tester that boasts overwhelming performance with the world's top market share, capable of detecting all defects in assembled boards through ultra-fast inspection. An in-circuit tester is a device that inspects the reliability of electrical connections between components and the board. By applying signals smaller than the operating current, it can identify defective areas and detect incorrect constants without damaging the components or the board. It is characterized by its ability to discover electrical defects that cannot be found through visual inspection (AOI), thereby enhancing quality assurance levels and making it easier to gain customer trust. The latest APT series has achieved a maximum probe movement speed increase of up to 1.5 times compared to previous models, thanks to improvements in high-speed drive motors and communication control, enabling high-speed inspections with a fastest step of 0.02 seconds. This reduces inspection time by more than 30% compared to previous models, contributing to further reductions in inspection costs. We welcome inquiries for trials/tests. If you have any issues with inspecting assembled boards, please feel free to contact us. *For detailed information, please refer to the catalog.*

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Basic Knowledge of In-Circuit Testing: What is the Difference Between Fixture-Based and Flying Probe Testing?

Basic Knowledge of In-Circuit Testing: What is the Difference Between Fixture-Based and Flying Probe Testing?

*Free materials are currently available. A must-see for those who don't know the basics of in-circuit testers, which you can't ask about now!

There are two probing methods for in-circuit testing (electrical inspection of printed circuit boards): fixture-based and flying probe. **Fixture-based** A test fixture with embedded contact probes makes contact with the test board, allowing all probes to simultaneously touch designated test points on the board. In this state, inspections of each electronic component are performed while switching the measurement lines with relays. The boards to be inspected require a program that combines each inspection and the production of a dedicated fixture, which presents challenges in terms of cost, speed, and storage space. **Flying Probe** Multiple arms holding probes perform probing at any point on the board. While probe movement time is required, resulting in longer inspection times compared to the fixture-based method, it does not require a fixture and can be set up simply by changing the program. This leads to time and cost savings when viewed from an overall process perspective. It is also suitable for inspecting boards in low-volume, high-variety production. The coordinates of the test points can be arbitrarily changed, making it easy to accommodate partial design changes to the board. It is also used for prototype board inspections and failure analysis.

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[Case Study] Replacement of Fixture-type In-Circuit Tester

[Case Study] Replacement of Fixture-type In-Circuit Tester

No need for jig creation, reducing running costs by over 90%!

We would like to introduce a case where a flying probe tester was implemented as a replacement for a fixture-type (press-type) tester. *Challenges* - In the case of high-density mounted circuit boards, there were components that could not be inspected with a fixture-type tester due to the difficulty of creating fixtures in narrow areas. - For low-volume production, such as maintenance parts after mass production, the cost of fixtures became high, increasing the overall maintenance costs. - There was a need to secure storage space for fixtures, which also added management burdens. *Implementation Effects* - Components with narrow pitch that could not be inspected with fixtures can now be tested, enhancing reliability. - The need for fixture production has been eliminated, and there are no longer any running costs associated with maintenance. - Warehouse space for fixture storage is no longer required, eliminating management burdens. For more details about the flying probe tester, please download the PDF catalog or feel free to contact us.

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Are you having trouble with automatic LED light emission inspection?

Are you having trouble with automatic LED light emission inspection?

Measure the emission color/brightness of LEDs quantitatively with a unique color sensor!! 【LED Color Test System】

Are you struggling with the labor involved in inspecting the LED's emission color and brightness? Takahashi's flying probe tester has an optional feature that allows for the measurement of LED emission color and brightness using a color sensor. There are cases where this feature has been used to switch from visual inspection to inspection using the flying probe tester. We would like to introduce the actual benefits of implementation. 1: Zero burden on visual inspectors Directly looking at the LED emission color can damage the eyes of the operator, but by switching to the flying probe tester, the burden can be reduced to zero. 2: Clarification of measurement standards Visual inspection can lead to variations in judgment criteria among inspectors, posing a risk of inconsistency. The inspection using a color sensor has clear judgment criteria based on numerical comparison, allowing for stable inspections. 3: No need for jig manufacturing costs In the case of LED inspection with the flying probe tester, there is no need to create dedicated jigs. We welcome inquiries for trials/tests as well. If you have any concerns, please feel free to contact us.

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Leave the introduction of flying probe testers to overseas markets to us!!

Leave the introduction of flying probe testers to overseas markets to us!!

Introduced in over 46 countries!! Takaya's tester is recognized worldwide.

Introducing flying probe testers to overseas locations / Please leave the local setup to Takaya. Takaya has a distribution agreement with Itochu Corporation for overseas sales, and we have established sales/service locations in the United States, Europe, China, and Southeast Asia, with numerous sales achievements in over 46 countries. Please make use of Takaya's flying probe testers, which are recognized by companies and industries around the world, not just in Japan. *For more detailed information, please see the related link page below.

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Introducing the history of Takaya Flying Probe Testers that are active around the world.

Introducing the history of Takaya Flying Probe Testers that are active around the world.

Implemented in numerous global EMS companies and manufacturers in over 46 countries!!

Takaya is a leading company in the implementation board inspection machine industry, boasting the world's top market share in flying probe testers. After developing the world's first flying probe tester in 1987, it was showcased at a technology exhibition in Germany the following year, receiving high praise from the local electronics industry and starting the expansion into the European market. In 1990, sales began in the United States, another industrially advanced country. In 1995, it received the award for "TEST INNOVATION OF THE YEAR," given to the most innovative inspection machines, widely recognizing its performance around the world. Currently, sales and service bases are established in the United States, Europe, China, and Southeast Asia, with numerous sales achievements in over 46 countries. To meet the high demands from various manufacturers, new models and groundbreaking new features are being added daily, and the sales network continues to expand. If you have any issues with electrical testing of implementation boards, please feel free to contact Takaya.

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Fastest in-circuit test! Case studies of flying probe testers.

Fastest in-circuit test! Case studies of flying probe testers.

The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing. Here are some examples of its applications.

■ Inspection of mass-produced products By connecting to loaders/unloaders, automated and unmanned inspections are possible even for large lots. ■ Inspection of multi-variety small quantity substrates There is no need for dedicated fixture manufacturing costs. It is difficult to identify defective areas in function tests, but it can be identified in in-circuit tests. ■ Inspection of prototype substrates We can respond immediately to design changes. Function tests are also possible, such as applying voltage to the substrate and confirming circuit operation (ON/OFF) or measuring direct current. ■ Implementation confirmation inspection during model switching We can reliably and quickly confirm the mounting program of the first lot and check for incorrect component sets on the mounter during model switching. ■ Defect analysis inspection It can be used for inspecting substrates that failed functional tests or for defect analysis of substrates that failed in the market. This allows for significant reductions in repair time and a decrease in discarded substrates. Additionally, there are various other applications where Takaya testers have been utilized successfully. For more details, please contact your sales representative.

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Integration with boundary scan testing using a flying probe tester.

Integration with boundary scan testing using a flying probe tester.

We will create new value through the mutual complementarity of ICT and BST.

In-circuit testing with flying probe testers excels at inspecting the electrical characteristics of implemented electronic components in analog circuits. However, components that cannot be probed make electrical testing difficult, and functional testing of digital circuits is challenging. On the other hand, boundary scan testing allows for quick interconnection testing between LSI pins and on-board programming for FPGAs, but it can only test digital circuits around ICs that comply with the boundary scan standard, and it also requires dedicated fixtures for connections. At Takaya Corporation, we possess technology that uses flying probes instead of fixtures that connect 4 to 5 scan-compatible pins and measuring instruments required for boundary scan testing. This allows for boundary scan testing even when the counterpart of a boundary scan-compliant IC is a non-boundary scan-compliant IC or passive components (such as connectors), by enabling the flying probe to function as a virtual boundary scan cell. With a single flying probe tester, it is possible to conduct comprehensive testing of both digital and analog circuits, thereby significantly enhancing testing efficiency compared to before.

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Introduction to the feature article of the European electronics industry magazine "EPP"

Introduction to the feature article of the European electronics industry magazine "EPP"

The European electronics industry magazine "EPP" has featured an article on Takaya's flying probe tester.

In the October 2023 issue of the European electronics industry magazine "EPP," an article introducing Takaya's flying probe testers has been published. Takaya Corporation and its European distributor, Cystec Europe, have maintained a long-standing partnership with Siemens in Germany. At Siemens' global flagship factory "SIEMENS Karlsruhe," 12 Takaya flying probe testers are currently in operation, ensuring the reliability of assembled circuit boards. The APT-1600FD-A achieves fully unmanned inspection 24 hours a day, 5 days a week through simultaneous inspection of both sides, automatic setup of inspection programs using new software, and automatic transport of circuit boards using an Autonomous Mobile Robot (AMR). Additionally, it supports the latest interface standards such as OPC UA, enabling integration with MES systems, as well as the establishment of an environment for monitoring operating rates and automatic switching of inspection programs based on defect statistics. Please check the related links and download page for more information.

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Low resistance measurement mode (0.1mΩ～) [Under development]

Low resistance measurement mode (0.1mΩ～) [Under development]

Introducing the Takaya Flying Probe Tester. We are challenging the measurement of low resistance (0.1mΩ and below).

At Takaya, in order to respond to further requests from our customers, we are advancing the development of a unique mode for the flying probe tester that adjusts the application parameters to measure lower resistances (0.1 mΩ and below). *Resolution: 0.001 mΩ Compared to handheld low-resistance meters, the flying probe tester has longer measurement lines (about 5 meters) from the measurement probes to the main unit, which necessitates machine design that considers external noise. We have expertise in this area. Additionally, when measuring with handheld probes, the force, angle, and position of the probe contact with the measurement target are not constant, which can lead to variations in measurement results and potential dents or damage to the object being measured. However, our probe system is well-regarded for its damage-free contact and high-precision contact. If you have concerns about the uncertainty of manual measurements or if the measurement process is too cumbersome, please feel free to reach out to us. We would be happy to accept test trials.

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38th Electronics Packaging Society Spring Conference Presentation Materials Released

38th Electronics Packaging Society Spring Conference Presentation Materials Released

The presentation materials for the 38th Electronics Packaging Society Spring Conference are now available.

The 38th Electronics Packaging Society Spring Conference was held from March 13 (Wednesday) to 15 (Friday), 2024, at the Noda Campus of Tokyo University of Science. At this conference, Mr. Yanagida, the Technical Department Manager of Takaya Corporation's Industrial Equipment Division, gave a presentation on "Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers." The presentation materials from that session have been made available, so please take a look at the related catalog page below. -------- Content -------- To ensure reliable assembly guarantees for printed circuit boards, electrical testing is essential. However, a single testing method alone does not provide sufficient test coverage. To address this issue, we introduce a hybrid testing system that integrates flying probe testers with JTAG boundary scan testing. By complementing each testing method, we can maximize the test coverage for high-density printed circuit boards, enabling more accurate fault diagnosis.

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Dual Side Flying Probe Tester APT-2600FD

Dual Side Flying Probe Tester APT-2600FD

A new innovation in substrate manufacturing. Achieving improved production efficiency and inspection accuracy!

The APT-2600FD is a next-generation dual-side flying probe tester that can perform combination testing with up to 6 probes using both upper and lower flying probes simultaneously. It improves test coverage while reducing the risk of product damage due to board flipping operations, significantly shortening inspection time. Equipped with a high-performance measurement system and a variety of features, it contributes to quality improvement from prototype to mass production. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

  • Other measuring instruments

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Flying Probe Tester APT-2400F / 2600FD

Flying Probe Tester APT-2400F / 2600FD

[39th NePCON Japan Domestic Debut] Supports inspection of high-density printed circuit boards with industry-leading accuracy! New model of flying probe tester.

Takaya Corporation announces the new model of its flying probe tester, "APT-2400F/APT-2600FD series," which reliably detects various defects in printed circuit boards through ultra-fast inspection. Equipped with cutting-edge inspection technology that can check fine component placements and connections with high precision, it ensures that even minor defects and risks are not overlooked, strongly supporting product quality improvement. Additionally, thanks to our unique control mechanisms and sensing technology, reliable inspections can be achieved even in fluctuating environments, contributing to quality management by reducing recall risks. Furthermore, the user-friendly interface allows anyone to operate it intuitively, helping to alleviate burdens in workplaces where labor shortages are becoming serious, while still ensuring high inspection accuracy and contributing to increased productivity. *For more details, please download the PDF document or feel free to contact us.*

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